文献类型：期刊文献

英文题名：Surface plasmon resonance sensor based on cross-linked chitosan immobilized onto the surface of optimization AgAu composite film for trace copper(II) ions detection

作者：Wang, Wenhua[1];Zhou, Xinlei[2];Wu, Shengxu[3];Li, Sidong[4];Wu, Weina[5];Xiong, Zhengye[1];Shi, Wenqing[1];Huang, Jiang[1];Yu, Qingxu[2]

机构：[1]Guangdong Ocean Univ, Sch Elect & Informat Engn, Zhanjiang, Guangdong, Peoples R China;[2]Dalian Univ Technol, Sch Optoelect Engn & Instrumentat Sci, Dalian, Liaoning, Peoples R China;[3]Guangdong Inst Anal, China Natl Analyt Ctr, Guangzhou, Guangdong, Peoples R China;[4]Guangdong Ocean Univ, Sch Chem & Environm, Zhanjiang, Guangdong, Peoples R China;[5]Guangdong Ocean Univ, Sch Math & Comp Sci, Zhanjiang, Guangdong, Peoples R China

年份：2019

卷号：58

期号：2

外文期刊名：OPTICAL ENGINEERING

收录：SCI-EXPANDED(收录号：WOS:000463894400055)、、EI(收录号：20191106618829)、Scopus(收录号：2-s2.0-85062636505)、WOS

基金：This work was supported by the Science and Technology Planning Project of Guangdong Province (No. 2015A030401094) and the National Natural Science Foundation of China (Nos. 61727816 and 61520106013).

语种：英文

外文关键词：optical sensor; surface plasmon resonance; semicylindrical prism; silver/gold composite film; cross-linked chitosan

外文摘要：We propose an intensity-modulated surface plasmon resonance (SPR) sensor based on a four-layer Kretschmann structural model. To achieve high-sensitivity intensity detection for the measured sample, a silver/gold(Ag/Au) composite film structure is proposed and optimized by a numerical simulation method, and then the chitosan thin film modified by glutaraldehyde cross-linked as an active layer for adsorbing measured sample is applied and immobilized onto the surface of the Ag/Au composite film by spin-coating technique. In addition, a reference beam is introduced into the system to raise its resolution and stability. Measurements are taken while varying the trace copper(II) ion (Cu2+) concentration from 0 to 5 ppm, and the SPR sensor is found to possess sensitivities of 0.9147 and 0.4466 ppm(-1) at Cu2+ concentrations of 0 to 3 and 3 to 5 ppm, respectively. The concentration resolution is 0.015 and 0.030 ppm for the trace Cu2+ concentration of 0 to 3 and 3 to 5 ppm, respectively. (C) 2019 Society of Photo-Optical Instrumentation Engineers (SPIE)