文献类型：期刊文献

中文题名：Relationship between normalized light intensity and attenuated total reflection ratio

英文题名：Relationship between normalized light intensity and attenuated total reflection ratio

作者：Wu, Yingcai[1,2];Gu, Zhengtian[2]

机构：[1]Guangdong Ocean Univ, Coll Informat, Zhanjiang 524025, Peoples R China;[2]Shanghai Univ Sci & Technol, Coll Sci, Shanghai 200093, Peoples R China

年份：2008

卷号：6

期号：1

起止页码：32

中文期刊名：中国光学快报：英文版

外文期刊名：CHINESE OPTICS LETTERS

收录：SCI-EXPANDED(收录号：WOS:000255024600010)、CSTPCD、、EI(收录号：20081011136531)、Scopus(收录号：2-s2.0-40049083853)、CSCD2011_2012、WOS、CSCD、PubMed

基金：This work was supported by the National Natural Science Foundation of China(No.6077035);the Research Project of Shanghai Municipal Education Commission(No.07ZZ87)

语种：英文

中文关键词：光强度;反射比率;信息技术;共鸣现象

外文关键词：Reflection - Surface plasmon resonance

中文摘要：Attenuated total reflection(ATR)ratio is usually utilized to study the properties of surface plasmon res- onance(SPR)sensors.The relationship between normalized light intensity and ATR ratio is investigated, and a modification coefficient is put forward to describe the relationship.A mathematical expression is built up for the coefficient based on Fresnel principle.The result shows that the ATR ratio,which cannot be measured directly in experiments,can be determined with the coefficient and the normalized intensity of light.The characteristic of the coefficient is also discussed.

外文摘要：Attenuated total reflection (ATR) ratio is usually utilized to study the properties of surface plasmon resonance (SPR) sensors. The relationship between normalized light intensity and ATR ratio is investigated, and a modification coefficient is put forward to describe the relationship. A mathematical expression is built up for the coefficient based on Fresnel principle. The result shows that the ATR ratio, which cannot be measured directly in experiments, can be determined with the coefficient and the normalized intensity of light. The characteristic of the coefficient is also discussed.